Abstract: Logic buit-in self-test (LBIST) is a technique in design for testability (DFT) that utilizes components of a circuit within a chip, board, or system to conduct self-testing of the digital logic circuit. LBIST plays a critical role in various applications, particularly those that are vital for life and mission, such as defense, aerospace, and autopilot systems. These applications necessitate the implementation of on-chip, on-board, or in-system selfchecks to enhance the overall system reliability and enable remote diagnostics. This article first presents the commonly used LBIST classifications and describes the classic and most successful LBIST architecture used in the industry, self-testing using MISR and parallel SRSG (STUMPS). Then, it summarizes the research teams and research progress at home and abroad. Then, it analyzes in detail the key technical points of LBIST such as the basic principle, timing control, deterministic self-test design, low-power design, X tolerance, and lists mainstream LBIST business tools, the software architecture and technical characteristics of LBIST are analyzed one by one. Finally, the problems that need to be further solved in current LBIST technology are discussed and prospects are made.